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Events
:: Upcoming Events :: Customized EOS & ESD in Microelectronics Course
Course Objectives
Electrostatic discharge (ESD) is
one of the major reliability issues in the electronics
industry. Damages due to EOS & ESD are estimated to
result in losses of billions of dollars, and account
for about 20% of the total device and system failures.
As technology progresses the issues related to ESD
become more predominant and the solutions become more
difficult. The solutions for avoiding or reducing EOS
& ESD failures, undertaking adequate prevention
measures while handling the ESD sensitive devices,
incorporating adequate protection and providing
awareness and training at all levels are discussed in
detail in this customizable one day course with many case studies.
Who Should Attend
The course can be customized based on the individual needs of any
companies to suite any level of employees
Generally it is aimed at engineers and managers of
various microelectronics industry who deal with
devices and systems.
Professionals including managers and engineering
professionals from semiconductor device and system
manufacturing, computer and peripherals industry,
testing and disk drive industry, who are involved in
design, process and product engineering, quality,
reliability, yield and failure analysis.
About the Instructor
Dr. M.K. Radhakrishnan, a scientist, academician and
technical consultant in the microelectronics area for
more than 25 years, has worked with many organizations
including Institute of Microelectronics Singapore, ST
Microelectronics and Philips at various senior
positions.
Currently he is the CTO of NanoRel
consultants He was an adjunct professor at National
University of Singapore. He is a technical consultant
to many organizations including International Telecom
Union (ITU), Geneva, as well as a number of
microelectronics MNCs in Asia, Europe and USA. Dr.
Radhakrishnan is the Editorial Board Member of
Microelectronics Reliability journal (UK). He is an
IEEE Distinguished Lecturer.
He was the General
Chairman of IEEE IPFA conference 1999 and currently
IPFA Board member. His contribution to scientific and
technical fields fetched him many honors including
Leadership Awards from IEEE (USA), ESDA (USA) award in
2004 for contributions in ESD technology, standards
and education.
Dr Radhakrishnan has been invited to
give keynote talks and special lectures at various
international conferences including the prestigious
IEDM, SPIE and MRS symposium. He is an advisor to many
international conferences and events in the field of
microelectronics.
He has designed, developed and
taught a number of courses in microelectronics
(process, reliability, ESD, failures analysis, etc) to
more than 3000 professionals at various institutions /
industries in Asia and Europe. He has more than 60
research publications, many of them invited papers. He
is a Senior Member of IEEE, Member of ESD Association,
USA and Member of EDFAS, USA.
Course Outline
Fundamentals of EOS&ESD
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Various EOS / ESD threats
-
Generation
of static charges
- Physics
of EOS & ESD
- Common
sources of ESD & Effects of environment
- Basics
of device and system level failures related to the
phenomena.
Concepts of ESD protection and
Testing
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The basics & philosophy of ESD
protection
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Various types of protection
circuits
-
Component level ESD testing &
Standards – HBM, MM,
CDM, etc.
-
Test standards & qualification :
ESDA – JEDEC – IEC
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System level ESD testing.
EOS & ESD failure modes and
mechanisms
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Identification & understanding
EOS & ESD inducedfailures
-
Failure mechanisms root cause
analysis - designer,manufacturer & user perspectives
-
Physics of ESD induced failures
technology specificissues
-
Case studies – device &
protection level.
- How to analyze EOS and ESD
failures.
ESD Prevention at Work Places
-
How to
minimize ESD at Work places
-
ESD
precautions at manufacturing and testing
centres
-
Material
and handling issues at storage and
transportation
-
User
awareness, training and audit
-
ESD
control management
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